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Accelerated Testing: Statistical Models, Test Plans, and Data Analysis

by Wayne B. Nelson

Wiley-Interscience

Paperback 623 pages English Dec 01, 2007

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Author:
Wayne B. Nelson
Publisher:
Wiley-Interscience
Publication Date:
Dec 01, 2007
Number of pages:
623 pages
Language:
English
Binding:
Paperback
ISBN-10:
0471697362
ISBN-13:
9780471697367