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Advanced Laser Diode Reliability

by Massimo Vanzi, Laurent Bechou, Mitsuo Fukuda, Giovanna Mura

ISTE Press - Elsevier

Hardcover 268 pages English July 13, 2021

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Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.
Author:
Massimo Vanzi, Laurent Bechou, Mitsuo Fukuda, Giovanna Mura
Publisher:
ISTE Press - Elsevier
Publication Date:
July 13, 2021
Number of pages:
268 pages
Language:
English
Binding:
Hardcover
ISBN-10:
1785481541
ISBN-13:
9781785481543