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Failure Analysis: High Technology Devices

by Daniel J. D. Sullivan, Eric J. Carleton

De Gruyter

Paperback/Technology & Engineering 120 pages English Oct 24, 2022

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The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

Author:: Daniel J. D. Sullivan, Eric J. Carleton
Publisher:: De Gruyter
Publication Date:: Oct 24, 2022
Number of pages:: 120 pages
Language:: English
Binding:: Paperback/Technology & Engineering
ISBN-10:: 150152478X
ISBN-13:: 9781501524783

Failure Analysis: High Technology Devices

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de Gruyter

Failure Analysis: High Technology Devices