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Industrial X-Ray Computed Tomography

by Simone Carmignato, Wim Dewulf, Richard Leach

Springer

Hardcover 376 pages English Oct 27, 2017

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Complete reference in X-Ray computed tomography (CT)Presents a special chapter on the calibration of CT systemsThe procedures for metrological performance verification are highlighted
Author:
Simone Carmignato, Wim Dewulf, Richard Leach
Publisher:
Springer
Publication Date:
Oct 27, 2017
Number of pages:
376 pages
Language:
English
Binding:
Hardcover
ISBN-10:
3319595717
ISBN-13:
9783319595719