Noise in Bipolar Junction Transistors at Cryogenic Temperatures. (Paperback)
Dissertation Discovery Company
Paperback 258 pages English December 08, 2019
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Noise in Bipolar Junction Transistors at Cryogenic Temperatures. (Paperback)
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Abstract: Fluctuation phenomenon (both thermal and shot noise) were measured in the junctions of bipolar junction transistors (BJT's) at liquid nitrogen temperatures and beyond. Dissertation Discovery Company and the University of Florida are dedicated to making scholarly works more discoverable and accessible throughout the world. This dissertation, "Noise in Bipolar Junction Transistors at Cryogenic Temperatures." by Thomas Edward Wade, was obtained from the University of Florida and is being sold with permission from the author. A free digital copy of this work may also be found in the university's institutional repository, the IR@UF. The content of this dissertation has not been altered in any way. We have altered the formatting in order to facilitate the ease of printing and reading of the dissertation.
- Author:
- Thomas Wade
- Publisher:
- Dissertation Discovery Company
- Publication Date:
- December 08, 2019
- Number of pages:
- 258 pages
- Language:
- English
- Binding:
- Paperback
- ISBN-10:
- 0530019485
- ISBN-13:
- 9780530019482