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X-Ray Structure Analysis

by Theo Siegrist

De Gruyter

Paperback 210 pages English Nov 22, 2021

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This book offers a compact overview on crystallography, symmetry, and applications of symmetry concepts. The author explains the theory behind scattering and diffraction of electromagnetic radiation. X-ray diffraction on single crystals as well as quantitative evaluation of powder patterns are discussed.

Author:: Theo Siegrist
Publisher:: De Gruyter
Publication Date:: Nov 22, 2021
Number of pages:: 210 pages
Language:: English
Binding:: Paperback
ISBN-10:: 3110610701
ISBN-13:: 9783110610703

X-Ray Structure Analysis

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de Gruyter

X-Ray Structure Analysis